Eitan Hershkovitz
Lawrence Berkeley National Laboratory
13 Papers
Eitan Hershkovitz is an academic researcher from Lawrence Berkeley National Laboratory. The author has contributed to research in topics: Catalysis & Magnet. The author has an hindex of 1, co-authored 1 publications.
Chat about Author
Papers
Quench Detection for High-Temperature Superconductor Conductors Using Acoustic Thermometry
TL;DR: In this paper, an active acoustic technique for detecting localized heating in a 1.2m-long sample of REBCO tape immersed in liquid nitrogen is presented. And the authors adapt this technique to subscale coils wound with a two-layer canted CORC dipole assembly.
Type II band alignment of NiO/α-Ga2O3 for annealing temperatures up to 600 °C
Xinyi Xia,Jian-Sian Li,Chao Ching Chiang,T. Yoo,Eitan Hershkovitz,Fan Ren,Honggyu Kim,Jihyun Kim,Dae-Woo Jeon,Ji-Hyoen Park,Stephen J. Pearton +10 more
TL;DR: In this article , the authors show that the band alignment of sputtered NiO on α-Ga2O3 remains type II, staggered gap for annealing temperatures up to 600°C, showing that this is a viable approach for hole injection in power electronic devices based on the alpha polytype of Ga2O 3.
1
Automated Phase and Orientation Mapping of Multiphase, Polycrystalline Hafnia-Zirconia Thin Films Using 4D-STEM.
TL;DR: Researchers employ 4D-STEM to automate phase and orientation mapping of multiphase, polycrystalline Hafnia-Zirconia thin films, enabling detailed characterization of complex material structures and properties.
1
Nanoscale Phase and Orientation Mapping in Multiphase Polycrystalline Hafnium Zirconium Oxide Thin Films Using 4D-STEM and Automated Diffraction Indexing.
Garrett Baucom,Eitan Hershkovitz,Paul Chojecki,Toshikazu Nishida,Roozbeh Tabrizian,Honggyu Kim +5 more
TL;DR: The development of ferroelectric hafnium zirconium oxide thin films hinges on accurate characterization of the complex phase and orientation landscape. This study introduces a novel approach using 4D-STEM and automated diffraction indexing to analyze multiphase polycrystalline HZO thin films, enabling the precise determination of phase composition, polarization axis alignment, and unique phase distribution across large working areas.
1