A system for accessing a surgical target site and related methods, involving an initial distraction system for creating an initial distraction corridor, and an assembly capable of distracting from the initial distraction corridor to a secondary distraction corridor and thereafter sequentially receiving a plurality of retractor blades for retracting from the secondary distraction corridor to thereby create an operative corridor to the surgical target site, both of which may be equipped with one or more electrodes for use in detecting the existence of (and optionally the distance and/or direction to) neural structures before, during, and after the establishment of an operative corridor to a surgical target site.

Surgical Access System and Related Methods

A system includes a computing device that selectively communicates with a self-powered device. The self-powered device has several modes of operation, including a first low-power mode of operation and a second high-power mode of operation. The self-powered device is to communicate with the computing device when the self-powered device is in the second mode of operation. The self-powered device may conserve power by alternating between the first mode of operation and the second mode of operation such that the self-powered device is in the second mode of operation during pre-determined or adaptively-determined time intervals. A duty-cycle of the second mode of operation relative to the first mode of operation may be in accordance with a power budget for the self-powered device.

Self-Powered Devices and Methods

A reusable burn-in/test fixture for discrete TAB die consists of two halves. The first half of the test fixture contains cavity in which die is inserted. When the two halves are assembled, the fixture establishes electrical contact with the die and with a burn-in oven. The test fixture need not be opened until the burn-in and electrical test are completed. The fixture permits the die to be characterized prior to assembly.

Discrete die burn-in for nonpackaged die

A multi-channel system for classifying particles in a mixture of particles according to one or more characteristics including a common source of electromagnetic radiation for producing a beam of electromagnetic radiation and a beam splitter for producing multiple beams of electromagnetic radiation for directing multiple beams of electromagnetic radiation to each interrogation location associated with each flow channel of the multi-channel system.

Apparatus, methods and processes for sorting particles and for providing sex-sorted animal sperm

A modular microfluidic system is described having at least one base board with a plurality of fluidly linked fluid supply apertures, optional intermediate level boards of equivalent construction, a plurality of microfluidic modules adapted to be detachably attached to the base board/ intermediate boards, each having one or more fluid inlets and/or outlets, and a plurality of fluid couplings preferably in the form of projecting ferrules to effect releasable fluid connection between a module and a base board/ intermediate level board via a supply aperture on the board and an inlet/outlet on the module. A method of providing a microfluidic system as a modular assembly is also described.

Modular microfluidic system

In one aspect the invention provides a method for laser induced breakdown of a material with a pulsed laser beam where the material is characterized by a relationship of fluence breakdown threshold (Fth) versus laser beam pulse width (T) that exhibits an abrupt, rapid, and distinct change or at least a clearly detectable and distinct change in slope at a predetermined laser pulse width value. The method comprises generating a beam of laser pulses in which each pulse has a pulse width equal to or less than the predetermined laser pulse width value. The beam is focused above the surface of a material where laser induced breakdown is desired. The region of least confusion (minimum beam waist or average spot size) is above the surface of the material in which laser induced breakdown is desired since the intensity of the beam falls off in the forward direction, preferably the region of the beam at or within the surface is between the region of least confusion and sufficient to remove material and the minimum intensity necessary for laser induced breakdown of the material to be removed, most preferably the region of minimum intensity is disposed at the surface of the material to be removed. The beam may be used in combination with a mask in the beam path. The beam or mask may be moved in the x, y, and Z directions to produce desired features. The technique can produce features smaller than the spot size and Rayleigh range due to enhanced damage threshold accuracy in the short pulse regime.

Method for minimizing sample damage during the ablation of material using a focused ultrashort pulsed laser beam

The present invention is directed to structures having a plurality of discrete insulated elongated electrical conductors projecting from a support surface which are useful as probes for testing of electrical interconnections to electronic devices, such as integrated circuit devices and other electronic components and particularly for testing of integrated circuit devices with rigid interconnection pads and multi-chip module packages with high density interconnection pads and the apparatus for use thereof and to methods of fabrication thereof. Coaxial probe structures are fabricated by the methods described providing a high density coaxial probe.

Probe structure having a plurality of discrete insulated probe tips projecting from a support surface, apparatus for use thereof and methods of fabrication thereof

A portable computer adapted for electrical connection to a docking station having multiple power modes of operation is described. The portable computer has one or more CPU chips which have at least two power modes of operation, a low power mode and a high power mode. When the portable computer is operated as a stand-alone computer, it operates in the low power mode. When the portable computer is operated while electrically connected to the docking station, it operates in a high power mode. The docking station has greater cooling capacity than the portable computer alone to provide enhanced cooling of the high power mode of operation.

Portable computer systems with thermal enhancements and multiple power modes of operation

An attenuator useful in measuring low level leakage currents is disclosed. The attenuator includes a plurality of current dividers coupled in cascade. Each current divider includes an input and two outputs between which the current entering the input is divided. The current exiting the last divider is significantly attenuated from that entering the attenuator. The attenuator output is coupled to the device under test and to one input of a differential amplifier. A known current is input to the differential amplifier and part is directed to the attenuator input and the other part to a current measuring device. The difference between the known current input to the differential amplifier and that measured is the current input to the attenuator. In the steady state, the current input to the differential amplifier from the current attenuator is about zero. Accordingly, the leakage current is equal to the known current entering the differential amplifier less the measured current divided by m, the attenuation provided by the attenuator.

Current attenuator useful in a very low leakage current measuring device

A TAB package comprises an elongated tape which has a plurality of sets of beam leads emplaced thereon and a plurality of electronic devices connected to the beam leads. At least a first beam lead of each set is connected to a common potential terminal on each device, and at least a second beam lead of each set is connected to a power terminal. A common potential bus is oriented along the elongated dimension of the tape and connects to the first beam leads, while a power bus is also oriented along the elongated dimension of the tape and is connected to the second beam leads. The application of power to the power bus and the simultaneous grounding of the common potential bus enables all electronic devices on the tape to be simultaneously energized and to be then subjected to an elevated temperature environment for static burn-in testing. To improve current conduction in the power and common potential buses, a tape comprising a non-conductive carrier and a pair of interposer/conductor tapes may be emplaced over the length of the tape bearing the chips. An additional spacer tape is then emplaced over the interposer tape and forces the interposer conductors into contact with the power and common potential buses.

Tab mounted chip burn-in apparatus

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