D.W. Hoffmann
University of Tübingen
7 Papers
34 Citations
D.W. Hoffmann is an academic researcher from University of Tübingen. The author has contributed to research in topics: Formal verification & Formal methods. The author has an hindex of 4, co-authored 7 publications.
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Papers
Simulation-guided property checking based on a multi-valued AR-automata
Jürgen Ruf,D.W. Hoffmann,Thomas Kropf,Wolfgang Rosenstiel +3 more
- 13 Mar 2001
TL;DR: This paper presents a method for verifying temporal properties of systems described in an executable description language that allows the user to specify properties about the system in finite linear time temporal logic.
Efficient design error correction of digital circuits
D.W. Hoffmann,Thomas Kropf +1 more
- 17 Sep 2000
TL;DR: An efficient symbolic method for automatic error correction of both combinational and synchronous sequential circuits and how the problem of rectifying sequential circuits can be reduced to a combinational problem without unrolling the combinational logic parts is presented.
19
Checking temporal properties under simulation of executable system descriptions
Jürgen Ruf,D.W. Hoffmann,Thomas Kropf,Wolfgang Rosenstiel +3 more
- 08 Nov 2000
TL;DR: This paper presents a method for verifying temporal properties of systems described in an executable description language that allows the user to specify properties about the system in finite linear time temporal logic (FLTL).
8
Simulation meets verification-checking temporal properties in SystemC
D.W. Hoffmann,J. Ruf,T. Kropf,Wolfgang Rosenstiel +3 more
- 05 Sep 2000
TL;DR: The author describes a simulation based method for verifying temporal properties of systems described in SystemC/sup TM, which allows the user to specify properties about the system in a finite version of linear time temporal logic (FLTL).
4
Automatic error correction of tri-state circuits
D.W. Hoffmann,Thomas Kropf +1 more
- 01 Oct 1999
TL;DR: This paper presents two solutions how the rectification method can be extended to locate and rectify errors in tri-state circuits, which makes the method applicable to a much broader range of circuits.
3