Abstract This paper presents a comparative EMI susceptibility study of different integrated operational transconductance amplifier (OTA) topologies. We analyzed conventional well-known amplifier topologies based on the Miller OTA and folded cascode concepts with lower power consumption. The output dc voltage shifts induced by power supply and input common mode high frequency disturbances are presented. On top of the EMI susceptibility comparison, we discuss PSRR and CMRR within large and small excitation signal with a new simulation setup. Even more, the back-gate connections of differential MOS pair in OTA input stage are investigated for EMI susceptibility impact as well.

An EMI susceptibility study of different integrated operational transconductance amplifiers

Mechanistic studies of the interaction of electromagnetic (EM) fields with biomaterials has motivated a growing need for accurate models to describe the EM behavior of biomaterials exposed to these fields. In this paper, biodegradable bone scaffolds were fabricated using Wangi rice starch and nano-hydroxyapatite (nHA). The effects of porosity and composition on the fabricated scaffold were discussed via electrical impedance spectroscopy analysis. The fabricated scaffold was subjected to an electromagnetic field within the X-band and Ku-band (microwave spectrum) during impedance/dielectric measurement. The impedance spectra were analyzed with lumped-element models. The impedance spectra of the scaffold can be embodied in equivalent circuit models composed of passive components of the circuit, i.e., resistors, inductors and capacitors. It represents the morphological, structural and chemical characteristics of the bone scaffold. The developed models describe the impedance characteristics of plant tissue. In this study, it was found that the ε′ and ε″ of scaffold composites exhibited up and down trends over frequencies for both X-band and Ku-band. The circuit models presented the lowest mean percentage errors of Z′ and Z″, i.e., 3.60% and 13.80%, respectively.

/pdf/lumped-element-circuit-modeling-for-composite-scaffold-with-2hjr59e7.pdf

Lumped-Element Circuit Modeling for Composite Scaffold with Nano-Hydroxyapatite and Wangi Rice Starch

This article proposes an electromagnetic compatibility improved bandgap voltage reference with a low current consumption of only 3.5 μA in an automotive environment with a wide temperature range from –40 °C to 160 °C and a high electromagnetic interference (EMI) robustness. The proposed reference is based on the well-known Brokaw bandgap with only five bipolar transistors in the bandgap core including collector current leakage compensation. We analyzed parasitic effects in the bandgap core such as the influence of parasitic capacitances between the substrate and the collectors of these bipolar transistors as well as the impact of the operational amplifier. We made recommendations on how to improve the bandgap EMI robustness. Simulation results were compared with measurements on a test chip. The measurement results showed excellent EMI robustness.

An Automotive Low-Power EMC Robust Brokaw Bandgap Voltage Reference

Temperature is a crucial indicator in monitoring industrial operations. Two-wire temperature transmitters, known for their precise measurements, are extensively used in sectors like crude oil extraction, refining, and fine chemicals. These transmitters can handle a maximum input voltage of 36 V and output a current signal up to 20 mA, enhancing resistance to electromagnetic interference and line noise while improving system compatibility and safety. In contrast, traditional low-dropout linear regulators (LDOs) typically have an input voltage below 6 V and suffer from limitations such as low power supply rejection ratio (PSRR), inadequate current driving capability, and significant temperature drift. This paper proposes a wide-input-range LDO with enhanced output accuracy and digital trimming, designed using the 180 nm BCD process. It incorporates dynamic mismatch compensation, digital trimming, and a strong-drive buffer, achieving a broad input voltage range and high PSRR with minimal temperature drift. The input voltage spans 6 V to 60 V, the output voltage is 1.8 V, and the PSRR reaches 124.5 dB. Across a temperature range of −40 °C to 130 °C, the maximum output voltage error is only 0.3%. This makes it highly suitable for high-precision circuit power supplies in industrial process control. 

A Wide-Input-Range LDO with High Output Accuracy Based on Digital Trimming Technique

This article presents a new electromagnetic compatibility improved bandgap voltage reference with a low-current consumption of only 3.2 μA. The reference is designed for automotive applications with an extended temperature range from −50 to 200 °C and a low electromagnetic interference (EMI) susceptibility. The designed reference comes from the well-known Brokaw bandgap topology utilizing only five bipolar junction transistors in a reference core with a collector current leakage compensation. We propose several novel EMI susceptibility improvements of the reference core with a new asymmetrical operational amplifier. Every improvement is discussed in detail and general recommendations, on how to decrease the bandgap EMI susceptibility, are presented. Simulation results are compared with measurements on a system on chip. Measurement results show dc voltage variation below 0.5% for 5 mW (7 dBm) supply EMI over the frequency range from 100 kHz to 1 GHz.

An EMI Susceptibility Improved, Wide Temperature Range Bandgap Voltage Reference

. This paper presents a comparative EMC susceptibility study of various integrated bandgap voltage reference cores. Conventional well-known bandgap references based on Kuijk, Brokaw and Tsividis concepts with reduced count of bipolar junction transistors in the core were analyzed. On top of the EMC susceptibility comparison, basic parameters like temperature drift, sensitivity to an operational amplifier input offset and line regulation are also discussed. The influence of a collector leakage current compensation at high temperatures is investigated as well.

/pdf/an-emc-susceptibility-study-of-integrated-basic-bandgap-gtpfg2sg.pdf

An EMC Susceptibility Study of Integrated Basic Bandgap Voltage Reference Cores

A linear high-frequency lumped-element model extraction from a two-terminal measured impedance by an improved element-by-element extraction method is described. This extraction method is extended to series and shunt resistors extraction as lossy elements of passive (linear) circuit network. The extracted linear circuit model from the two-terminal impedance of ideal and realistic passive networks is validated by SPICE simulations in a frequency domain. The extracted model can be used for more accurate electrical environment modeling and SPICE simulations of integrated circuits including external passive networks. An example of passive network synthesis from the two-terminal measured impedance by a proposed software is also presented.

/pdf/a-passive-network-synthesis-from-two-terminal-measured-2nelgownnq.pdf

A Passive Network Synthesis from Two-Terminal Measured Impedance Characteristic

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Papers

An EMC Susceptibility Study of Integrated Basic Bandgap Voltage Reference Cores

A Passive Network Synthesis from Two-Terminal Measured Impedance Characteristic

An EMI susceptibility study of different integrated operational transconductance amplifiers

An EMI Susceptibility Improved, Wide Temperature Range Bandgap Voltage Reference