X-ray interferometers were the first optical instruments which utilized many Bragg reflecting components in monolithic blocks of perfect crystal. They have made important contributions to our knowledge of fundamental constants, of Bragg reflexion X-ray optics, of strains and defects in crystals and of the optical constants of materials in the X-ray region of the electro-magnetic spectrum. Based on an oversimplified optical analogue, their mode of operation is described in detail. Current applications of crystal interferometers and possible future work is briefly reviewed.

Review Lecture: Ten Years of X-Ray Interferometry

X-ray and neutron interferometry

We present the first high precision measurement of the complete wavelength dependence of theK-edge dispersion including the whole range of the Kossel and Kronig structure. Synchrotron X-rays of DESY, Hamburg, have been used providing a highly collimated and intense beam with continuous spectral distribution for interferometric measurement. In comparing the result with other experimental and theoreticalf′ values and also with the absorption spectrum, quite good agreement is obtained.

Precise interferometric measurement of the NiK-edge forward scattering amplitude with synchrotron X-rays

IN THIS NEW BRANCH of applied x‐ray optics, crystals that obey Bragg's law of reflection are used as optical components. The physics of these devices is very simple and has long been available in the works of, for example, Max von Laue and Paul Ewald. Construction and operation of x‐ray interferometers, however, had to await the arrival of large, almost perfect, artificially grown single crystals. In the five years that have elapsed since the first successful x‐ray interferometer was made only a few of the possible applications have been exploited.

Interferometry with x rays

Measurements of photon-atom elastic scattering cross-sections in the photon energy range 1 keV to 4 MeV

The X-ray refractive index of lithium fluoride was measured to an accuracy of a few parts in 109 over the wavelength range from AgKβ1 (λ = 0.497058 A) to CuKα1 (λ = 1.54053 A). From these results the scattering factor for the forward direction and the anomalous dispersion corrections for fluorine were calculated. Good agreement was obtained with the values calculated using Honl's dispersion theory.

X‐Ray Interferometric Measurements of the Forward Scattering Amplitude for Lithium Fluoride

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X‐Ray Interferometric Measurements of the Forward Scattering Amplitude for Lithium Fluoride