Constant A.J. Putman
University of Twente
26 Papers
866 Citations
Constant A.J. Putman is an academic researcher from University of Twente. The author has contributed to research in topics: Microscope & Cantilever. The author has an hindex of 18, co-authored 26 publications.
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Papers
Tapping mode atomic force microscopy in liquid
TL;DR: In this article, the authors show that standard silicon nitride cantilevers can be used for tapping mode atomic force microscopy (AFM) in air, provided that the energy of the oscillating cantilever is sufficiently high to overcome the adhesion of the water layer.
A detailed analysis of the optical beam deflection technique for use in atomic force microscopy
TL;DR: In this paper, a Michelson interferometer and an optical beam deflection configuration (both shot noise and diffraction limited) are compared for application in an atomic force microscope.
Viscoelasticity of living cells allows high resolution imaging by tapping mode atomic force microscopy.
TL;DR: A new mode of operation is described in which the standard V-shaped silicon nitride cantilever is oscillated under liquid and damped by the interaction between AFM tip and sample surface, making it possible to study physiological processes, such as cell growth, with a minimal level of perturbation and high spatial resolution.
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Compact stand‐alone atomic force microscope
Kees van der Werf,Constant A.J. Putman,Bart G. de Grooth,Frans B. Segerink,Niek F. van Hulst,Jan Greve,Eric H. Schipper +6 more
TL;DR: In this paper, a stand-alone atomic force microscope (AFM) featuring large scan, friction measurement, atomic resolution, and liquid operation is developed, which can be combined with a (confocal) inverted microscope, yielding a versatile setup for biological applications.
New imaging mode in atomic-force microscopy based on the error signal
Constant A.J. Putman,Kees van der Werf,Bart G. de Grooth,Niko F. van Hulst,Jan Greve,Paul K. Hansma +5 more
- 01 May 1992
TL;DR: A new imaging mode, the error signal mode, is introduced to atomic force microscopy, which is especially suitable for imaging soft biological samples with a high level of detail without damaging the surface.
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