An optical testing circuit on a wafer includes an optical input configured to receive an optical test signal and photodetectors configured to generate corresponding electrical signals in response to optical processing of the optical test signal through the optical testing circuit. The electrical signals are simultaneously sensed by a probe circuit and then processed. In one process, test data from the electrical signals is simultaneously generated at each step of a sweep in wavelength of the optical test signal and output in response to a step change. In another process, the electrical signals are sequentially selected and the sweep in wavelength of the optical test signal is performed for each selected electrical signal to generate the test data.

Opto electrical test measurement system for integrated photonic devices and circuits

A semiconductor device may include a semiconductor wafer, and a reference circuit carried by the semiconductor wafer. The reference circuit may include optical DUTs, a first set of photodetectors coupled to outputs of the optical DUTs, an optical splitter coupled to inputs of the optical DUTs, and a second set of photodetectors coupled to the optical splitter. The optical splitter is to be coupled to an optical source and configured to transmit a reference optical signal to the first set of photodetectors via the optical DUTs and the second set of photodetectors.

Semiconductor device and wafer with reference circuit and related methods

A system for testing a device under test with respect to a far-field region of the device under test is provided. The system comprises a test unit, and an antenna connected to the test unit. The test unit is configured to determine several samples of measured power values at different distances between the antenna and the device under test. In addition to this, the test unit is configured to calculate a minimum far-field distance on the basis of the several samples of measured power values.

System and method for testing with respect to a far-field region

The invention discloses a test method, a test device and a test system. A controller is matched with a signal generator for testing. The controller respectively receives a plurality of test requests of a plurality of devices to be tested. The controller selects one of a plurality of test frequencies and a plurality of signal intensities included in the test request as a test item, generates notification information based on the test item, and broadcasts the notification information to the to-be-tested device, so that the to-be-tested device including the test request of the test item is subjected to frequency locking. The controller drives the signal generator to generate a test signal corresponding to a test item and transmits the test signal to the to-be-tested device.

Testing method, testing apparatus and testing system

The invention concerns an optoelectronic chip including a pair of optical inputs having a same bandwidth, and each being adapted to a different polarization, at least one photonic circuit to be tested, and an optical coupling device configured to couple the two inputs to the circuit to be tested.

Optoelectronic chip and method for testing photonic circuits of such chip

A testing device of a signaling mode and a testing method thereof are provided. The testing device includes a connecting module and a processor electrically connected to the connecting module. The connecting module is configured to electrically couple with a plurality of communication devices under tests (DUTs) simultaneously. The processor is configured to execute a network attaching procedure between the testing device and each of the communication DUTs, wherein the network attaching procedures are overlapped to be executed. The processor is further configured to test the communication DUTs after executing the network attaching procedures.

Testing device of signaling mode and testing method thereof

A testing device and a testing method are provided The testing device includes a connecting module and a processor electrically connected to the connecting module The connecting module is electrically coupled with a plurality of communication devices under tests (DUTs) synchronously The processor determines a schedule for the communication DUTs and tests the communication DUTs according to the schedule The testing method is applied to the testing device to implement the aforesaid operations

Testing device and testing method thereof

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Testing device of signaling mode and testing method thereof

Testing device and testing method thereof