C. Meyne
Technical University of Berlin
7 Papers
106 Citations
C. Meyne is an academic researcher from Technical University of Berlin. The author has contributed to research in topics: Ellipsometry & Metalorganic vapour phase epitaxy. The author has an hindex of 5, co-authored 7 publications.
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Papers
Temperature dependence of the InP(001) bulk and surface dielectric function
M. Zorn,T. Trepk,J.-T. Zettler,B. Junno,C. Meyne,K. Knorr,T. Wethkamp,M. Klein,M. S. Miller,Wolfgang Richter,Lars Samuelson +10 more
TL;DR: In this article, the bulk dielectric function, the surface reflectance anisotropy, and the surface dielectrics of InP(001) were determined from room temperature up to 875 K. Measurements were performed in-situ on as-grown samples in both a metal-organic vapour phase epitaxy and a chemical beam epitaxy (CBE) system using a rotating analyser type ellipsometer (SE) and a RAS.
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Growth oscillations with monolayer periodicity monitored by ellipsometry during metalorganic vapor phase epitaxy of GaAs(001)
TL;DR: In this article, the authors reported the observation of growth oscillations with monolayer periodicity by ellipsometry, with an oscillation amplitude of δ〈e1〉=0.05 using an optimized spectroscopic in situ ellipsometer.
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Growth of self-assembled (Zn)CdSe nanostructures on ZnSe by migration enhanced epitaxy
TL;DR: In this paper, the growth of CdSe on ZnSe by migration enhanced epitaxy has been studied in situ by means of reflection high-energy electron diffraction (RHEED) and reflection anisotropy spectroscopy (RAS).
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In situ monitoring of ZnS/GaP and ZnSe/GaAs metalorganic vapor phase epitaxy using reflectance anisotropy spectroscopy and spectroscopic ellipsometry
TL;DR: In this paper, reflectance anisotropy spectroscopy and spectroscopic ellipsometry were used to estimate the dielectric function that originate from the II-VI surface or from the buried II−VI/III-V interface.
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Real-time monitoring of P-based semiconductor growth by linear-optical spectroscopy
K. Knorr,A. Rumberg,Martin Zorn,C. Meyne,T. Trepk,J.-T. Zettler,Wolfgang Richter,P. Kurpas,Markus Weyers +8 more
- 21 Apr 1996
TL;DR: In this paper, reflectance anisotropy spectroscopy (RAS) and spectroscopic ellipsometry (SE) are applied simultaneously for a general characterisation of all steps of growth.
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