Bulk nanostructured materials from severe plastic deformation

Two different methods of diffraction profile analysis are presented. In the first, the breadths and the first few Fourier coefficients of diffraction profiles are analysed by modified Williamson–Hall and Warren–Averbach procedures. A simple and pragmatic method is suggested to determine the crystallite size distribution in the presence of strain. In the second, the Fourier coefficients of the measured physical profiles are fitted by Fourier coefficients of well established ab initio functions of size and strain profiles. In both procedures, strain anisotropy is rationalized by the dislocation model of the mean square strain. The procedures are applied and tested on a nanocrystalline powder of silicon nitride and a severely plastically deformed bulk copper specimen. The X-ray crystallite size distributions are compared with size distributions obtained from transmission electron microscopy (TEM) micrographs. There is good agreement between X-ray and TEM data for nanocrystalline loose powders. In bulk materials, a deeper insight into the microstructure is needed to correlate the X-ray and TEM results.

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Crystallite size distribution and dislocation structure determined by diffraction profile analysis: principles and practical application to cubic and hexagonal crystals

One of the most fundamental tasks in nanoscience is the accurate determination of particle sizes. Various methods have been developed to elucidate the mean particle diameter and the standard deviation for an ensemble of nanocrystals. However, good agreement between the results from different methods is not always encountered in the literature. In this study, we investigate colloidally prepared, highly monodisperse CoPt3 nanoparticles by transmission electron microscopy (TEM), small-angle X-ray scattering (SAXS), and powder X-ray diffraction (XRD). The results are compared in order to examine to which extent agreement is obtained by the different techniques when applied to small nanocrystals in the size range below 10 nm. In particular, the applicability of the simple Scherrer formula for size determination from the broadening of XRD reflections is checked. When the different techniques are correctly applied, the results from all methods are in good agreement.

Determination of Nanocrystal Sizes: A Comparison of TEM, SAXS, and XRD Studies of Highly Monodisperse CoPt3 Particles

Microstructures and properties of copper processed by equal channel angular extrusion for 1–16 passes

Nanocrystalline electrodeposited Ni: microstructure and tensile properties

It is well known that the Fourier analysis of X-ray diffraction peak profiles (as implemented by Warren and Averbach) can accurately determine the areaweighted average grain size of a fine-grained sample. Less well known is the fact that this method simultaneously yields a volume-weighted average grain size. Under certain circumstances, knowledge of these two weighted average grain sizes is sufficient to permit reliable estimation of the grain-size distribution, even when the distribution cannot be calculated directly from the Fourier coefficients, as is usually the case. We demonstrate this for a nanocrystalline Pd sample prepared by inert-gas condensation; average grain sizes and the grain-size distribution are estimated by X-ray diffraction profile analysis and compared with the same quantities measured directly by transmission electron microscopy (TEM). Very good agreement between the resulting average grain sizes is achieved only after compensating for the fact that diffraction profile analy...

Estimating grain-size distributions in nanocrystalline materials from X-ray diffraction profile analysis

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Estimating grain-size distributions in nanocrystalline materials from X-ray diffraction profile analysis