Bruce Kim
Samsung Techwin
4 Papers
49 Citations
Bruce Kim is an academic researcher from Samsung Techwin. The author has contributed to research in topics: Signal edge & Clock domain crossing. The author has an hindex of 3, co-authored 4 publications.
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Papers
Patent
Combining a clock signal and a data signal
Gyudong Kim,Ook Kim,Min-Kyu Kim,Bruce Kim,Seung Ho Hwang +4 more
- 15 Mar 2002
TL;DR: In this paper, a method of transmitting data in a system including at least one data channel and a separate clock channel is disclosed, which involves combining a clock signal to be transmitted on the clock channel with a data signal to generate a combined clock and data signal.
35
Patent
Apparatus for detecting defect in circuit pattern and defect detecting system having the same
Boo-Yang Jung,Seong-young Han,Bruce Kim +2 more
- 01 Jun 2004
TL;DR: In this article, an apparatus for detecting a defect of a circuit pattern is presented, which includes a resonator, a first power supply unit connected to one end of the resonator and a probe connected to the other end.
8
Patent
Method for combining clock signal and data signal
Seung Ho Hwang,Bruce Kim,Gyudong Kim,Min-Kyu Kim,Ook Kim,オオク キム,ギュドン キム,ブルース キム,ミンキュ キム,スンホ ホワン +9 more
- 29 Jun 2009
TL;DR: In this paper, the authors proposed a method for transmitting data in a system including at least one data channel and a separate clock channel, which involves combining a clock signal to be transmitted on the clock channel with a data signal to generate a combined clock and data signal.
4
Patent
Inspection system of electronic device
Seong-young Han,Boo-Yang Jung,Bruce Kim,ブルース キム,富陽 鄭,聖英 韓 +5 more
- 31 May 2005
TL;DR: In this article, an inspection system of an electronic device comprises a circuit for providing an electrical variable to the first end of the electronic device, a component connected to the second end of electronic device for changing the given value of the electrical variable, and an inspection section electrically connected to circuit, to measure the given changed value of electrical variable and then to compare the measured changed value with a reference value.
2