http://experimentationlab.berkeley.edu/sites/default/files/AFMImages/butt_AFM.pdf

Force measurements with the atomic force microscope: Technique, interpretation and applications

https://www.phys.ens.fr/IMG/pdf/precisionthompson.pdf

Precise nanometer localization analysis for individual fluorescent probes

Dynamic atomic force microscopy methods

D ESIGN CON SID ERATION S . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 253 Bll/ding a Trap . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 253 Beam Steering 254 Trapping Lasers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 257 T RAPPIN G TH EORY . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . .. . . . . . . . . . . . ... . . . . 260 Ray-Optics Theory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 262 Electromagnetic Theory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 264 F ORCE M EASUREM EN T . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 267 Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 267 Measurement of Trap Stiffness . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 270 Physics of Trup Stiffness Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 271 B�ownia,! Motion During Force Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . 272 PlcotenslOmeters 273 Other Applications of Picotensiometry .. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 276 Determinants of Trapping Forces . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 277

Biological applications of optical forces

http://kbose.weebly.com/uploads/1/0/4/9/10492046/force-distance_curves_by_atomic_force_microscopy_1.pdf

Force-distance curves by atomic force microscopy

We show that standard silicon nitride cantilevers can be used for tapping mode atomic force microscopy (AFM) in air, provided that the energy of the oscillating cantilever is sufficiently high to overcome the adhesion of the water layer. The same cantilevers are successfully used for tapping mode AFM in liquid. Acoustic modes in the liquid excite the cantilever. o­n soft samples, e.g., biological material, this tapping mode AFM is much more gentle than the regular contact mode AFM. Not o­nly is the destructive influence of the lateral forces minimized, but more important, the intrinsic viscoelastic properties of the sample itself are effectively used to ''harden'' the soft sample.

/pdf/tapping-mode-atomic-force-microscopy-in-liquid-58inpzczst.pdf

Tapping mode atomic force microscopy in liquid

A Michelson interferometer and an optical beam deflection configuration (both shot noise and diffraction limited) are compared for application in an atomic force microscope. The comparison shows that the optical beam deflection method and the interferometer have essentially the same sensitivity. This remarkable result is explained by indicating the physical equivalence of both methods. Furthermore, various configurations using optical beam deflection are discussed. All the setups are capable of detecting the cantilever displacements with atomic resolution in a 10 kHz bandwidth.

/pdf/a-detailed-analysis-of-the-optical-beam-deflection-technique-nmz8qd98me.pdf

A detailed analysis of the optical beam deflection technique for use in atomic force microscopy

Biomolecular interactions measured by atomic force microscopy.

A stand-alone atomic force microscope (AFM) featuring large scan, friction measurement, atomic resolution, and liquid operation, has been developed. Cantilever displacements are measured using the optical beam deflection method. The laser diode and focusing lens are positioned inside the piezo tube and the cantilever at the end of the piezo tube. Because the laser beam stays o­n the cantilever during scanning, the scan range is solely determined by the characteristics of the piezo tube. In our case 30 x 30 x 9.5 mum3 (xyz). The optical beam deflection detection method allows simultaneous measurement of height displacements and torsion (induced by lateral forces) of the cantilever. AFM images of dried lymphocytes reveal features in the torsion images, which are o­nly faintly visible in the normal height images. A new way of detecting the nonlinear behavior of the piezo tube is described. With this information the piezo scan is linearized. The nonlinearity in a 30-mum scan is reduced from 40% to about 1%, as is illustrated with images of a compact disk. The stand-alone AFM can be combined with a (confocal) inverted microscope, yielding a versatile setup for biological applications.

/pdf/compact-stand-alone-atomic-force-microscope-1efplocrf9.pdf

Compact stand‐alone atomic force microscope

A new imaging mode, the error signal mode, is introduced to atomic force microscopy. In this mode, the error signal is displayed while imaging in the height mode. The feedback loop serves as a high-pass filter that filters out the low spatial frequency components of the surface, leaving only the high spatial frequency components of the surface to contribute to the error signal and to be displayed. At a scan rate of typically 10 lines per second, images taken in this mode show very fine detail. Since the applied force stays nearly constant, the error signal mode is especially suitable for imaging soft biological samples with a high level of detail without damaging the surface.

New imaging mode in atomic-force microscopy based on the error signal

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