In contrast to vacuum-deposited Co/Cu multilayers the electrodeposited ones do not exhibit any oscillation behaviour in magnetic resistance properties as a function of the thackness of non-magnetic Cu layers. According to the magnetic investigations they show ferromagnetic and superparamagnetic character as a consequence of the lack of antiparallel coupling of neighbouring magnetic layers. Magnetic resistance observed on electrodeposited Co– Cu/Cu multilayers is believed to originate from the randomly antiparallel oriented magnetic domains. In the present paper the evolution of magnetic resistance properties is studaed against the average Cu concentration of multilayers prepared under a Cu deposition potential of –0.25 and –0.62 V, and the best magnetic resistance properties were found in the films with composition of 52% and 60% Cu, respectively. The average concentration was determined by electron microscopic and X-ray diffraction measurements.

Correlation between the average composition of coherent superlattice and the GMR properties of electrodeposited Co–Cu/Cu multilayers

Ni80Fe20/Cu muitilayers (Ni80Fe20=Py) belong to the sample systems, which show a Giant Magneto Resistance (GMR) interesting for magneto-electronic applications. The magnetic exchange coupling and thus the GMR depend sensitively on the layer structure and on the conditions of deposition. Regarding the structure characteristic correlation still clearing-up need exists. The composition of the layers from elements, which are neighbored in the periodic system of the elements, makes it necessary to use anomalous scattering conditions for the characterization by X-ray reflectometry. Therefore experiments were done with synchrotron radiation. Layer thickness, density of the layers and roughness of interfaces have been determined by fitting model parameters to the reflection curves. From fluorescence EXAFS measurements (Extended X-ray Absorption Fine Structure) near the Fe-K, Ni-K and Cu-K absorption edges the conclusion has been drawn that radial distributions of atoms in the thin layers correspond to those of compact polycrystalline material. Differences of the GMR values of the investigated samples can be attributed exclusively to the layer thickness and thickness relations, while influences of the roughness of the interfaces and structural differences play a subordinate role.

Characterization of Ni80Fe20/Cu Multilayers by X-Ray Reflection Using Anomalous Scattering

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Characterization of Ni80Fe20/Cu Multilayers by X-Ray Reflection Using Anomalous Scattering