Degradations of silicon photovoltaic modules: A literature review

Potential-induced degradation (PID) has received considerable attention in recent years due to its detrimental impact on photovoltaic (PV) module performance under field conditions. Both crystalline silicon (c-Si) and thin-film PV modules are susceptible to PID. While extensive studies have already been conducted in this area, the understanding of the PID phenomena is still incomplete and it remains a major problem in the PV industry. Herein, a critical review of the available literature is given to serve as a one-stop source for understanding the current status of PID research. This paper also aims to provide an overview of future research paths to address PID-related issues. This paper consists of three parts. In the first part, the modelling of leakage current paths in the module package is discussed. The PID mechanisms in both c-Si and thin-film PV modules are also comprehensively reviewed. The second part summarizes various test methods to evaluate PV modules for PID. The last part focuses on studies related to PID in the omnipresent p-type c-Si PV modules. The dependence of temperature, humidity and voltage on the progression of PID is examined. Preventive measures against PID at the cell, module and system levels are illustrated. Moreover, PID recovery in standard p-type c-Si PV modules is also studied. Most of the findings from p-type c-Si PV modules are also applicable to other PV module technologies.

https://pubs.rsc.org/en/content/articlepdf/2017/ee/c6ee02271e

Potential-induced degradation in photovoltaic modules: a critical review

https://iopscience.iop.org/article/10.1088/1361-6463/ab9c6a/pdf

The 2020 photovoltaic technologies roadmap

Photovoltaic (PV) solar energy recorded an exponential growth, in worldwide scale, over the last decade. Inevitably, mature PV markets are becoming highly competitive, boosting the need for research and development (R&D) on efficiency and reliability optimization, maintenance and fault diagnosis of key components, such as the PV modules. Indeed, a significant number of studies and technical papers have been published up today, based on an extensive feedback from both laboratory and real (field) investigations of faults and advanced diagnosis applications, especially for crystalline silicon (c-Si) PV modules. Undoubtedly, such experience is of particular interest for current PV plant operators, future investors, maintenance engineers and the R&D sector of PV industry. However, up today, such research, published in the form of reports, technical papers or even books, remains mostly dispersed and unclassified. This paper represents a comprehensive effort to review and highlight recent advances, ongoing research and future prospects, as reported in the literature, on the classification of faults in c-Si PV modules and advanced diagnosis in the field, by means of the increasingly popular method of infrared thermal (IRT) imaging. In particular, the first main part of this paper, reviews the characteristics of the most common fault types of operating PV modules, in terms of electrical and thermal response. Then, the second part gives a thorough review of recently published research, as well as the state-of-the-art, in the fields of IRT-based fault diagnosis and thermal image processing. On the basis of these two individual though supplementary review parts, an overview table is presented, followed by a discussion on the future prospects and challenges, towards the understanding and diagnosis of faults and their propagation in operating PV modules.

Faults and infrared thermographic diagnosis in operating c-Si photovoltaic modules: A review of research and future challenges

http://www-old.mpi-halle.mpg.de/mpi/publi/pdf/11827_14.pdf

Explanation of potential-induced degradation of the shunting type by Na decoration of stacking faults in Si solar cells

Potential Induced Degradation of Solar Cells and Panels

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Potential Induced Degradation of Solar Cells and Panels