B.E. Williams
North Carolina State University
12 Papers
261 Citations
B.E. Williams is an academic researcher from North Carolina State University. The author has contributed to research in topics: Diamond & Material properties of diamond. The author has an hindex of 9, co-authored 12 publications.
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Papers
Characterization of diamond thin films: Diamond phase identification, surface morphology, and defect structures
B.E. Williams,Jeffrey T. Glass +1 more
TL;DR: In this paper, the surface morphology of the diamond films was a function of position on the sample surface and the methane concentration in the feedgas, which was determined to be similar to natural diamond in terms of composition, structure, and bonding.
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Correlation of the electrical properties of metal contacts on diamond films with the chemical nature of the metal-diamond interface. I. Gold contacts: A non-carbide-forming metal.
TL;DR: In this paper, the I-V characteristics of titanium contacts on polycrystalline diamond have been correlated with x-ray-photoelectron-spectroscopy (XPS) and Auger-electron spectroscopy(AES) characterizations of the interface.
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Growth and characterization of diamond films on nondiamond substrates for electronic applications
W. Zhu,Brian R. Stoner,B.E. Williams,Jeffrey T. Glass +3 more
- 01 May 1991
TL;DR: In this paper, a review of diamond phase identification, nucleation and interfacial phenomena, morphology, and defects, as well as their correlations with electrical properties, are examined and discussed.
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Electron microscopy of vapor phase deposited diamond
TL;DR: In this article, high resolution electron microscopy (HREM) has been utilized to lattice image individual defects in these polycrystalline diamond films and a dramatic reduction in the defect density near the twin boundaries was observed.
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The analysis of defect structures and substrate/film interfaces of diamond thin films
TL;DR: In this paper, a low pressure methane-hydrogen gas mixture by microwave plasma enhanced chemical vapor deposition (CVD) has been examined by various transmission electron microscopy (TEM) techniques including bright and dark field, high resolution (HREM), selected area diffraction (SAD), and electron energy loss spectroscopy (EELS).
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