Avery Green
State University of New York System
13 Papers
37 Citations
Avery Green is an academic researcher from State University of New York System. The author has contributed to research in topics: Topological insulator & Chemistry. The author has an hindex of 6, co-authored 12 publications. Previous affiliations of Avery Green include State University of New York Polytechnic Institute & GlobalFoundries.
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Papers
Surface oxidation of the topological insulator Bi2Se3
Avery Green,Sonal Dey,Yong Q. An,Brendan O'Brien,Samuel O'Mullane,Bradley Thiel,Alain C. Diebold +6 more
TL;DR: In this article, the aging and oxidation of the surface of Bi2Se3 were investigated using X-ray photoelectron spectroscopy and variable angle spectroscopic ellipsometry.
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Fermi Level Manipulation through Native Doping in the Topological Insulator Bi2Se3.
Lee A. Walsh,Lee A. Walsh,Avery Green,Rafik Addou,Westly Nolting,Christopher R. Cormier,Adam T. Barton,Tyler R. Mowll,Ruoyu Yue,Ning Lu,Jiyoung Kim,Moon J. Kim,Vincent LaBella,Carl A. Ventrice,Stephen McDonnell,William G. Vandenberghe,Robert M. Wallace,Alain C. Diebold,Christopher L. Hinkle +18 more
TL;DR: Detailed guidance for EF control is provided that will finally enable researchers to fabricate high-performance devices that take advantage of transport through the topologically protected surface states of Bi2Se3.
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•Posted Content
Surface Oxidation of the Topological Insulator Bi2Se3
Avery Green,Sonal Dey,Yong Q. An,Brendan O'Brien,Samuel O'Mullane,Bradley Thiel,Alain C. Diebold +6 more
TL;DR: In this paper, the aging and oxidation of the surface of Bi2Se3 was studied and the results were consistent with nonlinear optical methods including rotational anisotropy second harmonic generation, which follow the time dependence of the changes to the top quintuple layer.
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Optical critical dimension metrology for directed self-assembly assisted contact hole shrink
Dhairya Dixit,Avery Green,Erik R. Hosler,Vimal Kamineni,Moshe Preil,Nick Keller,Joseph Race,Jun Sung Chun,Michael O’Sullivan,Prasanna Khare,Warren Montgomery,Alain C. Diebold +11 more
TL;DR: In this article, the application of Mueller matrix (MM) spectroscopic ellipsometry-based scatterometry to optically characterize DSA patterned contact hole structures fabricated with phase-separated polystyrene-b-polymethylmethacrylate (PS-b)-PMMA is described.
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