A "well behaving" property is defined for each line (in general a bundle of wires) connecting two combinational logic cells. This property can be easily taken into account in the design process of the circuit. It is shown that all tree-structured circuits of combinational logic cells are easily testable for multiple faults if each line is "well behaving". The size of the test set increases only linearly as the number of cells increases. It is also shown that if no line is well-behaving then only the trivial (exhaustive) test set exists for the circuit, which increases exponentially as the number of cells increases. If there are well-behaving as well as non-well-behaving lines in the circuit, then the size of the test set increases exponentially with the sizes of the non-well-behaving subtrees and linearly with the number of such subtrees.

Testing trees for multiple faults

This paper presents a method for generating tests for purely recursive digital filters. Generally, these consist of modules such as adders, multipliers and memory elements that are interconnected to realize complex functions. Our approach uses regular propagating test sequences that deal with the inherent parallel form of these structures. We derive a test sequence for the application of test vectors from a predetermined single-cell test set to all the cells of an N th order filter. Reduced testing time is achieved by using pipelining in vector application. A full speed test sequence is considered with a minimal number of test vectors.

On the Testability of Purely Recursive Digital Filters

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On the Testability of Purely Recursive Digital Filters