Rechargeable battery technologies have ignited major breakthroughs in contemporary society, including but not limited to revolutions in transportation, electronics, and grid energy storage The remarkable development of rechargeable batteries is largely attributed to in-depth efforts to improve battery electrode and electrolyte materials There are, however, still intimidating challenges of lower cost, longer cycle and calendar life, higher energy density, and better safety for large scale energy storage and vehicular applications Further progress with rechargeable batteries may require new chemistries (lithium ion batteries and beyond) and better understanding of materials electrochemistry in the various battery technologies In the past decade, advancement of battery materials has been complemented by new analytical techniques that are capable of probing battery chemistries at various length and time scales Synchrotron X-ray techniques stand out as one of the most effective methods that allow for near

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Synchrotron X-ray Analytical Techniques for Studying Materials Electrochemistry in Rechargeable Batteries

The PETRA IV project aims at upgrading the present synchrotron radiation source PETRA III at DESY into an ultralow-emittance source. Being diffraction limited up to X-rays of about 10 keV, PETRA IV will be ideal for three-dimensional X-ray microscopy of biological, chemical and physical processes under realistic conditions at length scales from atomic dimensions to millimetres and time scales down to the sub-nanosecond regime. In this way, it will enable groundbreaking studies in many fields of science and industry, such as health, energy, earth and environment, mobility and information technology. The science case is reviewed and the current state of the conceptual design is summarized, discussing a reference lattice, a hybrid multi-bend achromat with an interleaved sextupole configuration based on the ESRF-EBS design, in more detail as well as alternative lattice concepts.

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PETRA IV: the ultralow-emittance source project at DESY

Ferroelectric domain walls have emerged as a new type of interface in which the dynamic characteristics of ferroelectricity introduce the element of spatial mobility, allowing real-time adjustment of position, density and orientation of the walls. Because of electronic confinement, and of their distinct symmetry and chemical environment, the spatially mobile domain walls offer a wide range of functional electric and magnetic properties, representing excellent 2D components for the development of more agile next-generation nanotechnology. In this Review, we discuss how the field of domain-wall nanoelectronics evolved from classical device ideas to advanced concepts for multilevel resistance control in memristive and synaptic devices. Recent advances in modelling and atomic-scale characterization provide insight into the interaction of ferroelectric domain walls and point defects, offering additional routes for local property design. We also explore the discovery of functional domain walls in improper ferroelectrics and the intriguing possibility of developing the walls themselves into ultra-small electronic components, controlling electronic signals through their intrinsic physical properties. We conclude with a discussion of open experimental challenges and newly discovered domain-wall phenomena that may play an important role in future directions of the field. Ferroelectric domain walls hold great potential as multifunctional 2D systems for next-generation nanotechnology. This Review discusses recent advances in the field and new strategies for developing the domain walls into ultra-small electronic components.

Ferroelectric domain walls for nanotechnology

Bismuth ferrite (BiFeO3) is one of the very few known single-phase multiferroic materials. While the bulk compound is rhombohedral (R), the discovery of an epitaxial strain-induced structural transition into a so-called “super tetragonal phase” (T-phase) in this material incited a flurry of research activity focused on gaining an understanding of this phase transition and its possible functionalities. This metastable phase of BiFeO3 is also multiferroic, with giant ferroelectricpolarization and coexisting antiferromagnetic order, but above all it is the strain relaxation-induced phase mixtures and their outstanding piezoelectric and magnetoelectric responses which continue to intrigue and motivate the physicist and materials scientist communities. Here, we review the research into the T-phase and mixed-phase BiFeO3 system. We begin with a brief summary of the history of the T-phase and an analysis of the structure of the various phases reported in the literature. We then address important questions regarding the symmetry and octahedral rotation patterns and the (as yet underexplored) important role of chemistry in the formation of the metastable T-phase. We follow by describing the phase transitions in this material, and how these may hold promise for large magnetoelectric responses. Finally, we point out some experimental challenges inherent to the study of such a system, and potential pathways for how they may be overcome. It is our intention with this work to highlight important issues that, in our opinion, should be carefully considered by the community in order to use this fascinating materials system for a new paradigm of functionality.

A multiferroic on the brink: Uncovering the nuances of strain-induced transitions in BiFeO3

Functional and structural ceramics have become irreplaceable in countless high-tech applications. However, their inherent brittleness tremendously limits the application range and, despite extensive research efforts, particularly short cracks are hard to combat. While local plasticity carried by mobile dislocations allows desirable toughness in metals, high bond strength is widely believed to hinder dislocation-based toughening of ceramics. Here, we demonstrate the possibility to induce and engineer a dislocation microstructure in ceramics that improves the crack tip toughness even though such toughening does not occur naturally after conventional processing. With modern microscopy and simulation techniques, we reveal key ingredients for successful engineering of dislocation-based toughness at ambient temperature. For many ceramics a dislocation-based plastic zone is not impossible due to some intrinsic property (e.g. bond strength) but limited by an engineerable quantity, i.e. the dislocation density. The impact of dislocation density is demonstrated in a surface near region and suggested to be transferrable to bulk ceramics. Unexpected potential in improving mechanical performance of ceramics could be realized with novel synthesis strategies.

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Dislocation-toughened ceramics

Many physical and mechanical properties of crystalline materials depend strongly on their internal structure, which is typically organized into grains and domains on several length scales. Here we present dark-field X-ray microscopy; a non-destructive microscopy technique for the three-dimensional mapping of orientations and stresses on lengths scales from 100 nm to 1 mm within embedded sampling volumes. The technique, which allows ‘zooming’ in and out in both direct and angular space, is demonstrated by an annealing study of plastically deformed aluminium. Facilitating the direct study of the interactions between crystalline elements is a key step towards the formulation and validation of multiscale models that account for the entire heterogeneity of a material. Furthermore, dark-field X-ray microscopy is well suited to applied topics, where the structural evolution of internal nanoscale elements (for example, positioned at interfaces) is crucial to the performance and lifetime of macro-scale devices and components thereof.

/pdf/dark-field-x-ray-microscopy-for-multiscale-structural-389adbe9qu.pdf

Dark-field X-ray microscopy for multiscale structural characterization

Nature Communications 6: Article number: 6098 (2015); Published: 14 January 2015; Updated: 5 March 2015 The authors inadvertently omitted Frederik Stohr, who developed the silicon condenser lens used for the acquisition of data presented in this Article, from the author list. This has now been corrected in both the PDF and HTML versions of the Article.

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Corrigendum: Dark-field X-ray microscopy for multiscale structural characterization.

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Dark-field X-ray microscopy for multiscale structural characterization

Corrigendum: Dark-field X-ray microscopy for multiscale structural characterization.